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首页> 外文期刊>Journal of manufacturing science and engineering: Transactions of the ASME >Understanding limits on fin aspect ratios in counterflow microchannel arrays produced by diffusion bonding
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Understanding limits on fin aspect ratios in counterflow microchannel arrays produced by diffusion bonding

机译:了解通过扩散键合产生的逆流微通道阵列中鳍长宽比的限制

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This paper investigates the manufacturability limits of fin aspect ratios within two-fluid counter-flow microchannel arrays based on the stress state between laminae during diffusion bonding. In prior papers, it has been shown that the diffiusion bonding of two-fluid systems by microlamination can result in regions of the device that do not directly transmit bonding pressure and, consequently, result in unbonded regions leading to device leakage. A finite element model is used to analyze the stress state between laminae during diffusion bonding. The stress state is used to determine the critical stress necessary for diffusion bonding to occur in areas not receiving direct bonding pressure. Model results are compared with experimental results over a wide range of counterflow geometries. It has been found generally that a compressive stress state must exist in every part of the geometry in order to produce leak-free bonds. Implications of this finding on the design of two-fluid microchannel arrays are discussed.
机译:本文基于扩散键合过程中薄片之间的应力状态,研究了两流体逆流微通道阵列中翅片纵横比的可制造性极限。在先前的论文中,已经显示出通过微层压的双流体系统的扩散键合可导致器件的区域不直接传递键合压力,因此导致未键合的区域导致器件泄漏。有限元模型用于分析扩散粘结过程中层板之间的应力状态。应力状态用于确定在未承受直接粘结压力的区域中发生扩散粘结所需的临界应力。将模型结果与各种逆流几何结构上的实验结果进行比较。通常已经发现,在几何形状的每个部分中必须存在压应力状态,以便产生无泄漏的结合。讨论了这一发现对双流体微通道阵列设计的影响。

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