首页> 外文期刊>Journal of Korean Institute of Metal and Materials >The Effects of the Growth Conditions on the Thermoelectric Properties of n-Type 90percent Bi_2Te_3-10percent Bi_2Se_3 Single Crystals Grown by the Zone Melting Method
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The Effects of the Growth Conditions on the Thermoelectric Properties of n-Type 90percent Bi_2Te_3-10percent Bi_2Se_3 Single Crystals Grown by the Zone Melting Method

机译:生长条件对区域熔化法生长n型90%Bi_2Te_3-10%Bi_2Se_3单晶热电性能的影响

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摘要

The effects of the zone melting temperature and growth rate onthe thermoelectric properties for 0.15wt percent CdCl_2 and 0.05 wt percentCdCl_2 doped 90 percent Bi_2Te_3-10 percent Bi_2Se_3 single crystals wereinvestigated. The Seebeck coefficient and electrical resistivity of the 0.15wtpercent CdI_2 doped single crystals were initially decreased along theingots due to the condensation of iodine in the melts. The sharp increase of theSeebeck coefficient and electrical resistivity at the last-to-freeze region wereconsidered as results of the evaporation of iodine from the molten zone andthe compensation of electrons due to the formation of the antistructure defects.The figure-of-merit was enhanced with increasing the zone meltingtemperature and lowering the growth rate. The single crystels grown at thezone melting temperature of 800deg C and the growth rate of 0.1 mm/mmexhibited the maximum figure-of-merit of 2.8 X 10~(-3)/K.
机译:研究了区域熔化温度和生长速率对掺入90%Bi_2Te_3-10%Bi_2Se_3单晶的0.15wt%CdCl_2和0.05wt%CdCl_2的热电性能的影响。 0.15wt%的CdI_2掺杂的单晶的Seebeck系数和电阻率由于熔融物中碘的凝结而沿合金表面最初减小。考虑到最后冻结区的Seebeck系数和电阻率急剧增加,这是由于碘从熔融区蒸发并由于形成了抗结构缺陷而对电子进行了补偿的结果。随着区域熔融温度的升高和生长速率的降低。在800℃的区域熔化温度和0.1 mm / mm的生长速率下生长的单晶晶体的最大品质因数为2.8 X 10〜(-3)/ K。

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