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首页> 外文期刊>Journal of Korean Institute of Metal and Materials >Variation of thermoelectric properties along the growth direction of n-type 90% Bi2Te3-10%Bi2Se3 single crystals grown by the zone melting method
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Variation of thermoelectric properties along the growth direction of n-type 90% Bi2Te3-10%Bi2Se3 single crystals grown by the zone melting method

机译:通过区域熔化法生长的n型90%Bi2Te3-10%Bi2Se3单晶沿生长方向的热电特性变化

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摘要

CdI2 and CdCl2 doped n-type 90% Bi2Te3-10%Bi2Se3 single crystals were grown by the vertical zone meltingmethod, and the thermoelectric properties along the ingot wereanalyzed. The sharp increase of the Seebeck coefficient andelectrical resistivity at the last-to-freeze region were considered asa result of the evaporation of I and Cl from the molten zone. Themaximum Figure-of-Merit of the CdI2 and CdCl2 doped n-type90% Bi2Te3-10% Bi2Se3 single crystals were 2.7×10 –3/K and2.8×10 –3/K, respectively. The higher Figure-of-merit for theCdCl2 doped specimens was mainly due to the lower (k-kel). Theoptimum doping amount of CdI2 and CdCl2 for n-type 90%Bi2Te3-10% Bi2Se3 single crystals, grown by the vertical zonemelting method, were 0.075~0.10 wt% and 0.04~0.05 wt%, respectively.
机译:通过垂直区熔化法生长了掺CdI2和CdCl2的n型90%Bi2Te3-10%Bi2Se3单晶,并分析了沿铸锭的热电性能。由于熔融态中I和Cl的蒸发,最后冻结区的塞贝克系数和电阻率急剧增加。 CdI2和CdCl2掺杂的n型90%Bi2Te3-10%Bi2Se3单晶的最大品质因数分别为2.7×10 –3 / K和2.8×10 –3 / K。掺杂CdCl2的样品的品质因数较高主要是由于其较低的(k-kel)。通过垂直区熔化法生长的n型90%Bi2Te3-10%Bi2Se3单晶的最佳CdI2和CdCl2掺杂量分别为0.075〜0.10 wt%和0.04〜0.05 wt%。

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