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Estimated optical constants of gypsum in the regions of weak absorptions: Application of scattering theories and comparisons to independent measurements

机译:石膏在弱吸收区的估计光学常数:散射理论和比较在独立测量中的应用

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Diffuse reflectance spectra of multiple grain size fractions are used to estimate the optical constants of gypsum over the 0.4–15 μm wavelength region. Two independent scattering theories are used to iteratively determine the imaginary index of refraction from the measured reflectance. We compare the results of these two with each other and with imaginary indices of gypsum reported in the literature. We find that the scattering theory results are more sensitive in the infrared to weak spectral features that are clearly distinguished in the diffuse reflectance spectra. However, we find the scattering results provide a poor determination of the optical constants in the regions of relatively strong absorptions. At visible and near-infrared wavelengths we provide a comparison to the results obtained from analysis of the diffuse reflectance to results obtained from direct transmission measurements of several gypsum crystals having different sample thicknesses. We find the simplest models of the transmission reproduce the observed spectra. The different sample thicknesses for the transmission measurements and different grain sizes in the scattering theories allow evaluation of the imaginary index of refraction over a wide range of values. We find the imaginary index of refraction determined from scattering theories is in remarkable agreement with those obtained from transmission spectra. Different models of the reflectance and transmittance have associated strengths and weaknesses, and we conclude that combining these models provides a more accurate determination of the optical constants of a material when compared to using each separately. We combine the resulting real and imaginary indices of refraction with those reported at infrared wavelengths to provide values covering visual, near-infrared, and infrared wavelengths (0.4–333 μm, 25000–30 cm-1).
机译:使用多个粒度级分的漫反射光谱来估计石膏在0.4-15μm波长范围内的光学常数。两种独立的散射理论用于根据测得的反射率迭代确定虚构的折射率。我们将这两者的结果相互比较,并与文献中报道的假想的石膏指标进行比较。我们发现,散射理论的结果在红外线中对弱光谱特征更为敏感,而在漫反射光谱中则清楚地区分了弱光谱特征。但是,我们发现散射结果不能很好地确定相对强吸收区域中的光学常数。在可见光和近红外波长处,我们将漫反射分析获得的结果与具有不同样品厚度的几种石膏晶体的直接透射测量获得的结果进行了比较。我们发现最简单的传输模型可以再现观察到的光谱。用于透射测量的不同样品厚度和散射理论中的不同晶粒尺寸允许在很宽的数值范围内评估虚构的折射率。我们发现,由散射理论确定的虚构折射率与从透射​​光谱获得的虚构折射率显着一致。反射率和透射率的不同模型具有相关的优点和缺点,我们得出的结论是,与单独使用相比,组合这些模型可以更准确地确定材料的光学常数。我们将所得的实,虚折射率与在红外波长下报告的折射率相结合,以提供涵盖可见,近红外和红外波长(0.4–333μm,25000–30 cm-1)的值。

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