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首页> 外文期刊>Journal of Electron Spectroscopy and Related Phenomena >The origin of narrowing of the Si 2p coincidence photoelectron spectroscopy main line of Si(1 0 0) surface
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The origin of narrowing of the Si 2p coincidence photoelectron spectroscopy main line of Si(1 0 0) surface

机译:Si(1 0 0)表面的Si 2p符合光电子能谱主线变窄的起源

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摘要

The Si 2p photoelectron spectroscopy (PES) main line of Si(1 0 0) surface measured in coincidence with the singles (noncoincidence) Si L_(2,3)~-VV Auger-electron spectroscopy (AES) elastic peak is calculated. The agreement with the experiment is good. The present work is the first many-body calculation of the experimental coincidence PES spectrum of solid surface. The narrowing of the coincidence Si 2p PES main line compared to the singles one is due to the mechanism inherent in the coincidence PES. The inherent mechanism is explained by a many-body theory by which photoemission and Auger-electron emission are treated on the same footing.
机译:计算与单重(非重合)Si L_(2,3)〜-VV俄歇电子能谱(AES)弹性峰一致的Si(1 0 0)表面的Si 2p光电子能谱(PES)主线。与实验的一致性很好。目前的工作是对固体表面实验重合PES谱进行的第一个多体计算。符合Si 2p PES主线与单打相比变窄是由于符合PES固有的机制。内在机理由多体理论解释,通过该理论,光发射和俄歇电子发射可以在相同的基础上进行处理。

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