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首页> 外文期刊>Diffusion and Defect Data. Solid State Data, Part B. Solid State Phenomena >Magneto-optical Investigation of Thin-Film Magnetic Systems
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Magneto-optical Investigation of Thin-Film Magnetic Systems

机译:薄膜磁系统的磁光研究

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摘要

Results on the investigation of magnetic and magneto-optical properties ofnanocrystalline Fe/Zr and Fe/Zr, Mo/Fe thin-film systems are presented. The examined sampleswere prepared by DC magnetron sputtering technique. The structural investigations of the sampleswere performed by X-ray diffraction analysis. The hysteresis loops and spectral dependencies of thetransverse Kerr effect were measured employing the magneto-optical magnetometer and themagneto-optical spectrometer, respectively. The influence of the Zr and Mo layer thickness on themagnetic and magneto-optical properties of the examined samples was observed.
机译:给出了研究纳米晶Fe / Zr和Fe / Zr,Mo / Fe薄膜系统的磁和磁光性能的结果。通过直流磁控溅射技术制备了被检样品。通过X射线衍射分析对样品进行结构研究。利用磁光磁力计和磁光光谱仪分别测量了横向克尔效应的磁滞回线和光谱依赖性。观察到Zr和Mo层厚度对所检查样品的磁和磁光性能的影响。

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