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首页> 外文期刊>Diffusion and Defect Data. Solid State Data, Part B. Solid State Phenomena >Mechanism and Principles of Post Etch Al Cleaning With InorganicAcids
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Mechanism and Principles of Post Etch Al Cleaning With InorganicAcids

机译:无机酸蚀刻后清洗机理及原理

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摘要

In the metallurgical industry, Al cleaning has been carried out traditionally with inorganic acids,such as sulfuric acid and phosphoric acid, quite often with an oxidizer added such as sodium orpotassium dichromate [1], e.g. before bonding aluminum surfaces. In the semiconductor industry,the use of inorganic acids for cleaning aluminum with mixtures such as phosphoric/chromic andfuming nitric acid was used since the early 1980's. However, it was rather the use of hydroxylamine(NH2OH) for cleaning aluminum that found widespread use, since it could be used for both post-aluminum etch and post via-etch cleaning processes. In 1998, David Rath and RavikumarRamachandran patented a formulation using the traditional sulfuric acid and an oxidizer foraluminum cleaning as a basis, but they added a very small amount of HF (0-100ppm) [2]. Thistogether with other work reinvigorated the interest in using inorganic chemicals for aluminumcleaning.
机译:在冶金工业中,Al的清洗传统上是用无机酸(例如硫酸和磷酸)进行的,通常是用氧化剂(如重铬酸钠或重铬酸钾[1])添加的。在粘合铝表面之前。在半导体工业中,自1980年代初以来,就一直在使用无机酸与混合物(如磷酸/铬和发烟硝酸)清洗铝。但是,发现广泛使用的是羟胺(NH2OH)清洁铝,因为它既可用于铝后蚀刻又可用于通孔后蚀刻清洗工艺。 1998年,David Rath和RavikumarRamachandran获得了使用传统硫酸和用于铝清洗的氧化剂作为基础的配方专利,但他们添加了非常少量的HF(0-100ppm)[2]。这与其他工作一起激发了人们对使用无机化学物质进行铝清洁的兴趣。

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