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首页> 外文期刊>Journal of Electronic Materials >In-Situ Cleaning and Passivation of Oxidized Cu Surfaces by Alkanethiols and Its Application to Wire Bonding
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In-Situ Cleaning and Passivation of Oxidized Cu Surfaces by Alkanethiols and Its Application to Wire Bonding

机译:烷硫醇原位清洗和氧化铜表面钝化及其在引线键合中的应用

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摘要

The treatment of oxidized Cu surfaces using an alkanethiol as a reducing agent has been investigated.Exposure to a dilute solution of 1-decanethiol resulted in the complete removal and/or conversion of CuO and subsequent formation of a passivating thiolate film,a so-called self-assembled monolayer(SAM),on the underlying Cu/Cu_2O surface as evidenced by x-ray photoelec-tron spectroscopy(XPS)analysis.Morphological changes,monitored by scanning electron microscopy(SEM)and atomic force microscopy(AFM),revealed transformation of the rough,porous CuO layer into a comparatively smooth Cu/Cu_2O surface.Experiments performed on integrated circuit back-end-of-line(BEOL)die structures,comprising Cu/SiO_2 bond pads used as substrates for Cu wire bonding,demonstrate the potential application of a thiol-based in-situ cleaning-passivation procedure in microelectronics.
机译:已经研究了使用链烷硫醇作为还原剂处理氧化的铜表面的方法。暴露于1-癸烷硫醇的稀溶液导致CuO的完全去除和/或转化,并随后形成钝化的硫醇盐薄膜,即所谓的X射线光电子能谱(XPS)分析证明,在下层Cu / Cu_2O表面具有自组装单分子层(SAM)。通过扫描电子显微镜(SEM)和原子力显微镜(AFM)监测的形态变化得以揭示将粗糙的多孔CuO层转变为相对光滑的Cu / Cu_2O表面。在集成电路后端(BEOL)管芯结构上进行的实验,该结构包含用作Cu引线键合衬底的Cu / SiO_2键合焊盘,微电子学中基于硫醇的原位清洗钝化工艺的潜在应用。

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