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首页> 外文期刊>Journal of Electronic Materials >Study of the Transit-Time Limitations of the Impulse Response in Mid-Wave Infrared HgCdTe Avalanche Photodiodes
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Study of the Transit-Time Limitations of the Impulse Response in Mid-Wave Infrared HgCdTe Avalanche Photodiodes

机译:中波红外HgCdTe雪崩光电二极管冲激响应的时限研究

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摘要

The impulse response in frontside-illuminated mid-wave infrared HgCdTe electron avalanche photodiodes (APDs) has been measured with localized photoexcitation at varying positions in the depletion layer. Gain measurements have shown an exponential gain, with a maximum value of M velence 5000 for the diffusion current at a reverse bias of V_(b) velence 12 V. When the light was injected in the depletion layer, the gain was reduced as the injection approached the N+ edge of the junction. The impulse response was limited by the diode series resistance-capacitance product, RC, due to the large capacitance of the diode metallization. Hence, the fall time is given by the RC constant, estimated as RC velence 270 ps, and the rise time is due to the charging of the diode capacitance via the transit and multiplication of carriers in the depletion layer. The latter varies between t_(10-90) velence 20 ps (at intermediate gains M < 500) and t_(10-90) velence 70 ps (at M velence 3500). The corresponding RC-limited bandwidth is BW velence 600 MHz, which yields a new absolute record in gain-bandwidth product of GBW velence 2.1 THz. The increase in rise time at high gains indicates the existence of a limit in the transit-time-limited gain-bandwidth product, GBW velence 19 THz. The impulse response was modeled using a one-dimensional deterministic model, which allowed a quantitative analysis of the data in terms of the average velocity of electrons and holes. The fitting of the data yielded a saturation of the electron and hole velocity of v_(e) velence 2.3 X 10~(7) cm/s and v_(h) velence 1.0 X 10~(7) cm/s at electric fields E > 1.5 kV/cm. The increase in rise time at high bias is consistent with the results of Monte Carlo simulations and can be partly explained by a reduction of the electron saturation velocity due to frequent impact ionization. Finally, the model was used to predict the bandwidth in diodes with shorter RC velence 5 ps, giving BW velence 16 GHz and BW velence 21 GHz for x_(j) velence 4 (mu)m and x_(j) velence 2 (mu)m, respectively, for a gain of M velence 100.
机译:已在耗尽层中不同位置进行了局部光激发,测量了正面照明的中波红外HgCdTe电子雪崩光电二极管(APD)的脉冲响应。增益测量显示出指数增益,在反向偏置V_(b)声速12 V时,扩散电流的最大值为M声速5000。当光注入耗尽层时,增益随着注入而减小接近结点的N +边缘。由于二极管金属化的大电容,脉冲响应受到二极管串联电阻电容乘积RC的限制。因此,下降时间由RC常数给出,估计为RC velence 270 ps,上升时间归因于二极管电容通过耗尽层中载流子的传输和倍增而充电。后者在t_(10-90)velence 20 ps(在中间增益M <500)和t_(10-90)velence 70 ps(在Mvelence 3500)之间变化。相应的RC限制带宽为BW velence 600 MHz,这在GBW velence 2.1 THz的增益带宽积中产生了新的绝对记录。高增益时上升时间的增加表明在传输时间限制的增益带宽乘积GBW velence 19 THz中存在限制。脉冲响应是使用一维确定性模型建模的,该模型可以根据电子和空穴的平均速度对数据进行定量分析。数据的拟合在电场E下产生了电子和空穴速度的饱和度v_(e)velence 2.3 X 10〜(7)cm / s和v_(h)velence 1.0 X 10〜(7)cm / s > 1.5 kV / cm。高偏压下上升时间的增加与蒙特卡洛模拟的结果一致,并且可以部分解释为由于频繁的碰撞电离导致电子饱和速度降低。最后,该模型用于预测RC周期短于5 ps的二极管的带宽,对于x_(j)velence 4μm和x_(j)velence 2(mu),给出BW velence 16 GHz和BW velence 21 GHz。 m分别获得M velence 100。

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