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首页> 外文期刊>Journal of Electronic Materials >A New LPE Growth Method of Semiconductor Heterostructures With Thickness Profile Variation of Epitaxial Layers
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A New LPE Growth Method of Semiconductor Heterostructures With Thickness Profile Variation of Epitaxial Layers

机译:具有外延层厚度分布变化的半导体异质结构的LPE生长新方法

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摘要

We have investigated and developed a method for the LPE growth of layers with approximately parabolic cross section. The channels were created during the growth process by modulating the liquid phase thickness with W or Mo wires parallel to the substrate. The main parameters of the channel can be controlled by changing the wire's diameter and its distance from the substrate. This method can be incorporated directly into the growth process of a laser structure with an unstable resonator without the need of additional treatments as chemical etching, to produce the channel structure.
机译:我们已经研究和开发了一种用于LPE生长具有近似抛物线形截面的层的方法。在生长过程中通过使用平行于基板的W或Mo线调制液相厚度来创建通道。通道的主要参数可以通过更改导线的直径及其与基板的距离来控制。该方法可以直接结合到具有不稳定谐振器的激光结构的生长过程中,而无需进行化学刻蚀等额外处理即可产生通道结构。

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