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首页> 外文期刊>Journal of Electronic Materials >Coarsening of the Sn-Pb Solder Microstructure in Constitutive Model-Based Predictions of Solder Joint Thermal Mechanical Fatigue
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Coarsening of the Sn-Pb Solder Microstructure in Constitutive Model-Based Predictions of Solder Joint Thermal Mechanical Fatigue

机译:基于本构模型的焊点热机械疲劳预测中的Sn-Pb焊料微观结构的粗化

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摘要

An expression for the coarsening rate of the Pb-rich phase particles was determined through isothermal aging experiments and comparative literature data as:#lambda# = #lambda#_o + {[4.10 × 10~(-5) e~(-11023/T)+ 15.6 × 10~(-8) e~(-3123/T) (d#gamma#/dt)]t}~0.256where #lambda#_o and #lambda# are the initial and final mean Pb-rich particle diameters, vespectively (mm); T is temperature (degK); t is time (s); and d#gamma#/dt is the strain rate (s~(-1)). The phase coarsening behavior showed good agreement with previous literature data from isothermal aging experiments. The power-law exponent, p, for the Pb-rich phase size coarsening kinetics:#lambda#~p - #lambda#_o~p ≈ tincreased from a value of 3.3 at the low aging temperature regime (70-100deg C) to a value of 5.1 at the hgih temperature regime (135-170deg C), suggesting that the number of short-circuit diffusion paths had increased with further aging. This expression provides an important basis for the microstructurally-based, constitutive equation used int he visco-plastic model for TMF in Sn-Pb solder. The revised visco-plastic model was exercised using a through-hole solder joint configuration. Initial data indicate a satisfactory compatibility between the coarsening expression and the constitutive equation.
机译:通过等温时效实验和比较文献数据确定了富Pb相颗粒的粗化速率表达式:#lambda#=#lambda#_o + {[4.10×10〜(-5)e〜(-11023 / T)+15.6×10〜(-8)e〜(-3123 / T)(d#gamma#/ dt)] t}〜0.256,其中#lambda#_o和#lambda#是富铅的初始和最终均值颗粒直径(毫米); T是温度(degK); t是时间(秒); d#gamma#/ dt是应变率(s〜(-1))。相粗化行为与等温老化实验的先前文献数据显示出良好的一致性。富Pb相尺寸粗化动力学的幂律指数p:从低时效温度范围(70-100°C)的3.3值增加到#lambda#〜p-#lambda#_o〜p≈ hgih温度范围(135-170℃)下的值为5.1,表明随着进一步老化,短路扩散路径的数量增加了。该表达式为在Sn-Pb焊料中TMF的粘塑性模型中使用的基于微观结构的本构方程提供了重要基础。修改后的粘塑性模型是使用通孔焊点配置进行的。初始数据表明,粗化表达式与本构方程之间具有令人满意的兼容性。

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