ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method

摘要

This paper introduces a method to reduce the requirements of the test sources for evaluating the non-linearity characteristics of Analogue-to-Digital converters. The method is based on a non-interleaved Double-Histogram test independent of the test signal waveform. It has been validated by simulation results in a 16-bit pipeline A/D converter and by an experimental example using the AD6644 commercial converter.