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>ADC non-linearity low-cost test through a simplified double-histogram method
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ADC non-linearity low-cost test through a simplified double-histogram method
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机译:通过简化的双直方图方法进行ADC非线性低成本测试
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摘要
This paper introduces a method to reduce the requirements of the test sources for evaluating the non-linearity characteristics of Analogue-to-Digital converters. The method is based on a non-interleaved Double-Histogram test independent of the test signal waveform. It has been validated by simulation results in a 16-bit pipeline A/D converter and by an experimental example using the AD6644 commercial converter.
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