A Case Study on Phase-Locked Loop Automatic Layout Generation and Transient Fault Injection Analysis

摘要

This paper reports a case study on the automatic layout generation and transient fault injection analysis of a Phase-Locked Loop (PLL). A script methodology was used to generate the layout based on transistor level specifications. Experiences were performed in the PLL in order to evaluate the sensibility against transient faults. The circuit was generated using the STMicroelectronics HCMOS8D process (0.18 μm). Results reveal the PLL sensitive points allowing the study and development of techniques to protect this circuit against transient faults.