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Digital Calibration for 8-bit Delay Line ADC Using Harmonic Distortion Correction

机译:使用谐波失真校正的8位延迟线ADC的数字校准

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Delay line ADCs are becoming increasingly attractive with technology scaling to smaller dimensions with lower voltages. However, linearity, which has always been an issue, becomes a problem with longer delay lines. Resolutions of reported delay-line ADCs are hardly more than 4 bits with sampling rates of hundreds of MHz. In this paper, we first present a technique which extends harmonic distortion correction techniques to digital calibration of a delay-line ADC. In our simulation results, digital calibration improves SNDR and SFDR to 42.5 dB and 45.4 dB, respectively, compared with the original SNDR of 25.6 dB and the original SFDR of 25.7 dB. In order to reduce the convergence time of the calibration, we inject a periodic 3-bit gray code sequence instead of three pseudorandom numbers for harmonic distortion correction to digitally calibrate an 8-bit delay line ADC. In our simulation results, the SNDR is significantly improved from 25.6 dB to 42.5 dB, with a calibration time of 13.5 milliseconds, which is 64X faster than harmonic distortion correction with the pseudorandom numbers.
机译:随着技术的发展,以更低的电压将延迟线ADC缩小到更小尺寸,其吸引力越来越大。然而,一直是一个问题的线性度成为更长延迟线的问题。报告的延迟线ADC的分辨率几乎不超过4位,采样速率为数百MHz。在本文中,我们首先提出了一种将谐波失真校正技术扩展到延迟线ADC的数字校准的技术。在我们的模拟结果中,数字校准将SNDR和SFDR分别提高到42.5 dB和45.4 dB,而原始SNDR为25.6 dB和原始SFDR为25.7 dB。为了减少校准的收敛时间,我们注入了一个周期性的3位格雷码序列而不是三个伪随机数,以进行谐波失真校正,从而对8位延迟线ADC进行数字校准。在我们的仿真结果中,SNDR从25.6 dB显着提高到42.5 dB,校准时间为13.5毫秒,比使用伪随机数的谐波失真校正快64倍。

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