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首页> 外文期刊>Journal of Applied Polymer Science >The conductive behavior and structural characteristics in the I+-beam-implanted layer of plasma-polymerized pyrrole film
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The conductive behavior and structural characteristics in the I+-beam-implanted layer of plasma-polymerized pyrrole film

机译:等离子体聚合吡咯膜的I +束注入层中的导电行为和结构特征

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A dense organic film was prepared by plasma polymerization of pyrrole. A 20 keV I+ implantation at a fluence of 1 x 10(16) ions cm(-2) was used to produce a conducting surface layer due to doping. The characteristics of the implanted layer have been investigated using ion beam analysis techniques, X-ray photoelectron spectroscopy, and near-infrared to ultraviolet spectroscopy. The charge carriers transport in this implanted layer was also analyzed in the temperature region of 120 to 297 K. (C) 1998 John Wiley & Sons, Inc. J Appl Polym Sci 69: 1743-1751, 1998. [References: 26]
机译:通过吡咯的等离子体聚合制备致密的有机膜。由于掺杂,以1 x 10(16)离子cm(-2)的通量进行20 keV I +注入,以产生导电表面层。已使用离子束分析技术,X射线光电子能谱和近红外至紫外光谱研究了注入层的特性。还在120至297 K的温度范围内分析了该注入层中的载流子传输。(C)1998 John Wiley&Sons,Inc. J Appl Polym Sci 69:1743-1751,1998。[参考:26]

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