Etude des proprietes elastiques de multicouches Ni/Mo en couplant un dispositif de traction a un diffractometre de rayons X

摘要

Elastic constants of thin films are misunderstood and subject to polemic in the case of multilayer systems with low period thicknesses. When straining in the elastic domain the film/substrate set inside a diffractometer, it is then possible to determine by x-ray diffraction the Poisson's ratio of the studied film. We applied this method to a multilayer system containing 13 bilayers of 8 and 15 nm thick layers of nickel and molybdenum respectively. The results obtained on the Poisson's ratio value in molybdenum layers demonstrate the feasibility of such measurements.