Etude par diffraction de rayons X de la relaxation thermique et des echanges induits par les rayons ultraviolets dans les couches minces de calcogenures amorphes de Ge-As-Se

摘要

Thermal relaxation and the relaxation induced by UV radiation in thin amorphous films of composition Ge_xAs_(40-x)Se_(60) (0 ≤ x ≤ 40) have been investigated by diffraction de rayons X. The structural results allowed to suggest the models for the atomic scale transformations.