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Carrier compensation in (001) n-type diamond by phosphorus doping

机译:(001)n型金刚石中磷掺杂的载流子补偿

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Phosphorus (P) doping of (001) diamond was investigated focusing on [CH_4]/[H_2] and [PH_3]/[CH_4] gas flow ratio dependence during homoepitaxial growth. P concentration was primarily controlled by gas flow ratio in the same manner as (111) doping, although the controllable range stayed narrow due to lower doping efficiency. Electrical properties of (001) P-doped diamond films were investigated by Hall effect measurements and the doping level dependence of carrier compensation was discussed. The compensation ratio remained almost constant with increasing P concentration, indicating that P doping itself induces acceptor states compensating P donors.
机译:研究了(001)金刚石的磷(P)掺杂,重点研究了同质外延生长过程中[CH_4] / [H_2]和[PH_3] / [CH_4]气体流量比的依赖性。 P浓度与(111)掺杂同样地主要由气体流量比控制,但由于掺杂效率低,因此可控制范围狭窄。通过霍尔效应测量研究了(001)掺P金刚石薄膜的电性能,并讨论了载流子补偿的掺杂水平依赖性。随着P浓度的增加,补偿率几乎保持恒定,表明P掺杂本身会诱导受体状态补偿P供体。

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