785 nm Raman spectroscopy of CVD diamond films

摘要

Raman spectroscopy is a powerful technique often used to study CVD diamond films, however, very little work has been reported for the Raman study of CVD diamond films using near-infrared (785 nm) excitation. Here, we report that when using 785 nm excitation with 1 urn spot size, the Raman spectra from thin polycrystalline diamond films exhibit a multitude of peaks (over 30) ranging from 400-3000 cm~(-1). These features are too sharp to be photoluminescence, and are a function of film thickness. For films >30 mu m thick, freestanding films, and for films grown in diamond substrates the Raman peaks disappear. This suggests that the laser is probing the vibrations of molecular units at the grain boundaries of the disordered crystallites present at the interface between the diamond and substrate.