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Heteroepitaxial diamond detectors for heavy ion beam tracking

机译:异质外延金刚石探测器,用于重离子束跟踪

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摘要

Heteroepitaxy has been shown to produce uniform crystals of single crystal diamond. An advantage of heteroepitaxy is its potential for creating materials suitable for energetic particle detectors that require large-area plates. At this point, there is little information on the electronic properties of heteroepitaxial material and its suitability for detector use is an open question. To address this issue, a heteroepitaxially grown single crystal was used for high-temperature DC transport measurements and for evaluation as a heavy ion particle detector. Using a transverse geometry with an as-grown Ir film as one electrode and a diffused Ti-Au top electrode, the sample showed no detectable current leakage at room temperature up to 100 V bias. At temperatures between 250 and 600 deg C, the DC electrical conductivity exhibited thermally activated behavior with an activation energy of 1.4 eV. A ~(76)Ge beam with an energy of 100 MeV/u produced at the Coupled Cyclotron Facility at Michigan State University was used to test detector performance. At typical beam fluences, single events were recorded with instrumentally limited rise times of 0.5 ns and pulse width 1 ns. Single pulses corresponded to an energy loss DELTA E=46 MeV. A pulse-height resolution of the energy loss signal of DELTA E/E= 18 percent was measured. Of particular importance is the fast performance at high beam intensities. No degradation of timing properties and energy resolution could be observed with count rates up to 10~6 particles/s. These measurements reflect the properties of the as-grown heteroepitaxial diamond crystal to which no subsequent processing was applied. It is anticipated that by using thicker crystals that allow the defective initial growth region to be removed mechanically, greatly improved energy resolution can be observed.
机译:异质外延已显示可产生单晶金刚石的均匀晶体。异质外延的一个优点是它具有创造适用于需要大面积平板的高能粒子检测器材料的潜力。在这一点上,关于异质外延材料的电子特性的信息很少,其对于检测器的适用性是一个悬而未决的问题。为了解决这个问题,将异质外延生长的单晶用于高温直流输运测量并作为重离子粒子检测器进行评估。使用具有生长的Ir膜作为一个电极和扩散的Ti-Au顶部电极的横向几何结构,样品在室温下(高达100 V偏压)都没有可检测到的电流泄漏。在250至600摄氏度之间的温度下,直流电导率表现出热活化行为,活化能为1.4 eV。密歇根州立大学耦合回旋加速器装置产生的能量为100 MeV / u的〜(76)Ge光束用于测试探测器的性能。在典型的光束注量下,以仪器限定的上升时间0.5 ns和脉冲宽度1 ns记录单个事件。单脉冲对应于能量损失ΔE= 46MeV。测量了能量损失信号的DELTA E / E = 18%的脉冲高度分辨率。特别重要的是在高光束强度下的快速性能。计数速率高达10〜6个粒子/秒时,不会观察到定时性能和能量分辨率的下降。这些测量结果反映了未进行后续加工的异质外延生长金刚石晶体的性能。可以预料的是,通过使用较厚的晶体,可以以机械方式去除有缺陷的初始生长区域,从而可以观察到大大提高的能量分辨率。

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