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Nano-diamond films produced from CVD of camphor

机译:樟脑化学气相沉积法制备纳米金刚石薄膜

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摘要

Nano-diamond films were deposited by chemical vapour deposition (CVD) of camphor(C{sub}10H{sub}16O) and hydrogen (~75 vol.%) on glass (at 523-623 K) and quartz Si substrate(at 523-713 K). The films had low values of surface roughness (~17 nm on quartz) along with highvalues of hardness and band gap. IR studies of the films deposited on Si substrate indicated the filmsto be transparent in the IR region. Optical properties of the films deposited on quartz (fused silica) andglass (Corning) substrates were studied. The absorption data in the below band gap region wereutilized to estimate the strain (2-12× 10{sup}-3), stress (1.9- 8.4 GPa) and hardness (47-62 GPa)in the films. The ETIR studies of the films did not show absorption around 2900 cm{sup}-1, while theRaman spectra indicated a sharp peak (with FWHM~8 cm{sup}-1) at 1337 cm{sup}-1corresponding to good quality diamond films.
机译:通过樟脑(C {sub} 10H {sub} 16O)的化学气相沉积(CVD)和氢气(〜75 vol。%)在玻璃(523-623 K)和石英Si衬底(在150nm)上沉积纳米金刚石薄膜。 523-713 K)。薄膜的表面粗糙度值低(在石英上约为17 nm),而硬度和带隙值较高。对沉积在Si衬底上的膜的IR研究表明,该膜在IR区域中是透明的。研究了沉积在石英(熔融石英)和玻璃(Corning)基板上的薄膜的光学性能。利用带隙以下区域的吸收数据估算薄膜的应变(2-12×10 {sup} -3),应力(1.9-8.4 GPa)和硬度(47-62 GPa)。薄膜的ETIR研究未显示2900 cm {sup} -1附近的吸收,而拉曼光谱显示在1337 cm {sup} -1处有一个尖峰(FWHM〜8 cm {sup} -1),对应于优质钻石电影。

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