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Microstructural characterisation of Cr-Al-N nanocomposites deposited by cathodic arc evaporation

机译:阴极电弧蒸发沉积Cr-Al-N纳米复合材料的微观结构表征

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The Cr-Al-N nanocomposites with a variable [Cr]/([Cr]+[A1]) ratio were deposited by cathodic arc evaporation. The investigations using XRD and TEM were done to analyse the microstructure of the coatings. The XRD phase analysis showed that Cr-rich coatings up to [Cr]/([Cr]+[Al]) = 0.54 consisted of a single fcc phase. With increasing Al-content, wurtz-itic AIN developed as a second phase. The Cr-Al-N nanocomposites are composed of nano-sized clusters that consist of partially coherent nanocrystallites. This microstructural model was obtained from the combination of the XRD line profile analysis and TEM. The mutual misorientation of the fcc nanocrystallites within the clusters was between 0.5° and approx. 1° as calculated from the onset of their partial coherence. Detailed TEM investigations per-formed on Cr-rich coatings revealed that in the single phase coatings the nano-sized clusters are separated by dislocation walls. The dislocations building the walls could be identified as screw dislocations.
机译:通过阴极电弧蒸发沉积[Cr] /([[Cr] + [A1])比可变的Cr-Al-N纳米复合材料。使用XRD和TEM进行了研究,以分析涂层的微观结构。 XRD相分析表明,高达[Cr] /([[Cr] + [Al])= 0.54的富Cr涂层由单个fcc相组成。随着Al含量的增加,Wurtz-itic AIN被开发为第二阶段。 Cr-Al-N纳米复合材料由纳米簇组成,簇由部分相干的纳米晶体组成。该微结构模型是通过XRD线轮廓分析和TEM的结合获得的。 fcc纳米晶体在簇内的相互错位在0.5°和大约2之间。从它们的部分相干开始算起的1°。对富铬涂层进行的详细TEM研究表明,在单相涂层中,纳米级团簇由位错壁隔开。建造墙壁的位错可以被识别为螺丝位错。

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