...
首页> 外文期刊>Vacuum: Technology Applications & Ion Physics: The International Journal & Abstracting Service for Vacuum Science & Technology >Thermomechanical behavior of Ti-Ni shape memory alloy films deposited by DC magnetron sputtering
【24h】

Thermomechanical behavior of Ti-Ni shape memory alloy films deposited by DC magnetron sputtering

机译:直流磁控溅射沉积Ti-Ni形状记忆合金膜的热力学行为

获取原文
获取原文并翻译 | 示例

摘要

In this study, thermomechanical properties of titanium-nickel (Ti-Ni) shape memory alloy (SMA) films are investigated in order to derive constitutive relations. Ti-Ni SMA films, deposited by DC magnetron sputtering under controlled film composition, are characterized by uniaxial tensile tests. At room temperature (R.T.), Ti-Ni films having Ti contents less than 50 at% exhibit superelastic behavior, and those having Ti contents greater than 50 at% exhibit shape memory behavior. However, the Ni-53.2 at% Ti film fractured at a tensile strain of 0.8% because of an increase in brittleness with increasing Ti content. At elevated temperatures, Ti-Ni films having Ti contents of 50.2 to 52.6 at% undergo phase change from martensite to austenite. The Young's modulus of the Ti-Ni films depends on temperature at each phase, regardless of film composition. Film composition does, however, affect the measured material constants b(A), b(M), c(A), and c(M). Stress-strain curves calculated from the constructed constitutive equation closely agree with those obtained from tensile tests, for both the martensite and austenite phases. The constitutive equations are expected to find great utility in the design of Ti-Ni film-actuated microelectromechanical systems (MEMS). (c) 2005 Elsevier Ltd. All rights reserved.
机译:在这项研究中,研究了钛镍(Ti-Ni)形状记忆合金(SMA)薄膜的热机械性能,以得出本构关系。通过单轴拉伸试验表征了在受控的膜组成下通过直流磁控溅射沉积的Ti-Ni SMA膜。在室温(R.T.)下,Ti含量小于50at%的Ti-Ni膜表现出超弹性行为,而Ti含量大于50at%的Ti-Ni膜表现出形状记忆行为。但是,Ni-53.2原子%的Ti膜在0.8%的拉伸应变下破裂,这是因为随着Ti含量的增加脆性增加。在升高的温度下,Ti含量为50.2-52.6at%的Ti-Ni膜经历从马氏体到奥氏体的相变。 Ti-Ni膜的杨氏模量取决于每个相的温度,与膜组成无关。但是,膜组成确实会影响测量的材料常数b(A),b(M),c(A)和c(M)。对于马氏体和奥氏体相,从构造的本构方程计算出的应力-应变曲线与拉伸试验获得的应力-应变曲线非常吻合。本构方程有望在Ti-Ni薄膜驱动的微机电系统(MEMS)的设计中找到很大的用途。 (c)2005 Elsevier Ltd.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号