首页> 外文期刊>Vacuum: Technology Applications & Ion Physics: The International Journal & Abstracting Service for Vacuum Science & Technology >Synthesis of boron-doped diamond films by DC plasma CVD using a CH4+CO2+H-2 gas mixture at lower substrate temperature and formation of an n-Si/p-diamond heterojunction
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Synthesis of boron-doped diamond films by DC plasma CVD using a CH4+CO2+H-2 gas mixture at lower substrate temperature and formation of an n-Si/p-diamond heterojunction

机译:在较低的基板温度下使用CH4 + CO2 + H-2气体混合物通过DC等离子体CVD合成硼掺杂的金刚石薄膜,并形成n-Si / p金刚石异质结

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Diamond films were synthesized by direct current plasma chemical vapour deposition using a CH4 + CO2 + H-2 gas mixture on Si substrates. The optimum deposition conditions were determined. It was found that 0.4 A/cm(2) current density. at applied voltage of 1 kV, resulted in good-quality diamond films. The substrate temperature was 750 K which is considerably lower than the conventional requirement of similar to1100 K. Boron doping was achieved by passing a portion of the gas mixture through boric acid dissolved in methanol. The boron-doped p-type diamond films were deposited on an n-type single crystalline Si substrate and an n-Si/p-diamond heterojunction was fabricated. The p-n junction was characterized in terms of current-voltage (I-V) and capacitance-voltage (C-V) measurements. (C) 2003 Elsevier Ltd. All rights reserved. [References: 29]
机译:金刚石薄膜是通过在Si基板上使用CH4 + CO2 + H-2气体混合物通过直流等离子体化学气相沉积法合成的。确定了最佳沉积条件。发现0.4 A / cm(2)的电流密度。在1 kV的施加电压下,可以获得高质量的金刚石薄膜。衬底温度为750 K,大大低于传统的类似于1100 K的要求。通过使一部分气体混合物通过溶于甲醇的硼酸来实现硼掺杂。将硼掺杂的p型金刚石膜沉积在n型单晶Si衬底上,并制造n-Si / p金刚石异质结。通过电流-电压(I-V)和电容-电压(C-V)测量来表征p-n结。 (C)2003 Elsevier Ltd.保留所有权利。 [参考:29]

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