Heusler films and multilayers: X-ray resonant magnetic scattering and polarized neutron reflectivity studies on the relation between structure and magnetism

摘要

We have studied the structural properties and the magnetization density profiles in multilayers of the Heusler phase Co{sub}2MnGe with three different spacer layers: V, Au, and AlO{sub}x, using hard X-ray scattering, soft X-ray resonant magnetic scattering, and polarized neutron reflectivity. We have found that the spacer layer has a significant effect on the magnetization profile of the Co{sub}2MnGe layer. In all cases the interlayers at the top and the bottom of the Heusler layer exhibit a reduced magnetic moment, the thickness of which depends on the spacer layer and increases from 0.5 nm for V, to 0.6 nm for Au and 1 nm for AlO{sub}x.