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首页> 外文期刊>Chinese physics letters >Near-field fluorescence and topography characterization of a single nanometre fluorophore by apertureless tip-enhanced scanning near-field Microscopy
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Near-field fluorescence and topography characterization of a single nanometre fluorophore by apertureless tip-enhanced scanning near-field Microscopy

机译:无孔尖端增强扫描近场显微镜对单个纳米荧光团的近场荧光和形貌表征

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摘要

Tip-enhanced near-field fluorescence and topography characterization of a single nanometre fluorophore is conducted by using an apertureless scanning near-field microscopy system. A fluorophore with size 80 nm is mapped with a spatial resolution of 10 nm. The corresponding near-lield fluorescence data shows significant signal enhancement due to the apertureless tip-enhanced effect. With the nanometre spatial resolution capability and nanometre local tip-enhanced effect, the apertureless tip-enhanced scanning near-field microscopy may be further used to characterize a single molecule by realizing the local near-lield spectrum assignment corresponding to topography at nanometre scale.
机译:通过使用无孔扫描近场显微镜系统对单个纳米荧光团进行尖端增强的近场荧光和形貌表征。以10 nm的空间分辨率绘制大小为80 nm的荧光团。由于无孔尖端增强效应,相应的近场荧光数据显示出明显的信号增强。凭借纳米空间分辨能力和纳米局部尖端增强效应,无孔尖端增强扫描近场显微镜可以进一步用于表征单个分子,方法是实现与纳米级形貌相对应的局部近场光谱分配。

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