Nanometer-scale layer modification of polycarbonate surface by scratching with tip oscillation using an atomic force microscope

摘要

This paper presents a simple and reliable technique for nanometer-scale layer modification of a polycarbonate (PC) surface using an atomic force microscope (AFM). The AFM tip, coated with amorphous carbon was made to oscillate vertically at its resonance frequency. With tip oscillating in tapping mode, it scan-scratched the PC surface to make the desired modification. This action carved the PC surface without distorting it. The bottom of the depression made by scan-scratching with the oscillating tip was obviously flat in comparison with the area scan-scratched without tip oscillation in contact mode. The depth of the scan-scratched depression was controlled by adjusting the amplitude of oscillation and the scanning speed of scratching. This technique is very interesting for microtribology and surface modification.