首页> 外文期刊>Tsvetnye Metally: The Soviet Journal of Non-Ferrous Metals >PRODUCTION AND ELECTRICAL PROPERTIES OF SEMI-INSULATING GALLIUM ARSENIDE WITH LOW CHROME CONCENTRATIONS
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PRODUCTION AND ELECTRICAL PROPERTIES OF SEMI-INSULATING GALLIUM ARSENIDE WITH LOW CHROME CONCENTRATIONS

机译:低铬半绝缘砷化镓的生产和电性能

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摘要

The goal of this work was to find single crystals of semi-insuulating gallium arsenide from melts with varying chrome contents in low concentration areas as wall as to examine the effect of chrome concentration in a welt on the electrical properties of gallium arsenide. The residual impurities content in gallium arsenide depends on the purity of the original material and on the conditions for producing single crystals. Noncompensated gallium arsenide can be a p or a type conductivity. Semi-insulating properties are obtained only by compensating for the levels of fine impurities by deep levels of the opposite type. In the technologies used today, for production of single crystals of gallium arsenide, the predominant electrically-active impurities are silicon (shallow donor) and carbon (shallow acceptor). Chrome (a deep acceptor) and oxygen (a deep donor) are used as alloying impurities to compensate for the fine impurities.
机译:这项工作的目的是从低浓度区域(壁)中的铬含量变化的熔体中找到半绝缘砷化镓的单晶,以检验熔体中铬浓度对砷化镓电性能的影响。砷化镓中的残留杂质含量取决于原始材料的纯度以及生产​​单晶的条件。未补偿的砷化镓可以是p或类型电导率。仅通过用相反类型的深水平补偿细小杂质的水平才能获得半绝缘性能。在当今用于制造砷化镓单晶的技术中,主要的电活性杂质是硅(浅施主)和碳(浅受主)。铬(一种深的受主)和氧气(一种深的供体)被用作合金杂质,以补偿细小杂质。

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