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Adhesion and friction of nanoparticles/polyelectrolyte multilayer films by AFM and micro-tribometer

机译:原子力显微镜和微摩擦计测量纳米颗粒/聚电解质多层膜的附着力和摩擦力

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摘要

The in situ CuS nanoparticle/polyelectrolyte multilayer (NPs/PEM) films have been prepared using the layer-by-layer method and the in situ synthesize method. The NPs/PEM films were characterized by atomic force microscope (AFM), ultraviolet-visible (UV-vis) spectroscopy, X-ray photoelectron spectroscopy (XPS), and transmission electron microscope (TEM). It was found that the adhesive forces between probe and sample are decreased by compositing in situ CuS nanoparticles. From the investigation of the nano- and micro-tribological behaviors, the NPs/PEM film has a lower friction force and a better anti-wear property than the pure polyelectrolyte multilayer film.
机译:原位CuS纳米粒子/聚电解质多层(NPs / PEM)膜已使用逐层方法和原位合成方法制备。 NPs / PEM薄膜通过原子力显微镜(AFM),紫外可见光谱(UV-vis),X射线光电子能谱(XPS)和透射电子显微镜(TEM)进行表征。发现通过原位复合CuS纳米颗粒可降低探针与样品之间的粘附力。通过对纳米和微观摩擦学行为的研究,NPs / PEM薄膜具有比纯聚电解质多层薄膜更低的摩擦力和更好的抗磨性能。

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