Application of Young Slits Technique: Measurement of thePhase of the Diffracted Field in Optical Domain

摘要

This study presents a new technique to measure the phase difference between twodiffracted fields: The field diffracted by a reference object and the field diffracted by anunknown object. For that we use the interferential technique of Young slits. We measuredthe phase difference between the diffracted fields of two rods of resin. And knowing thephase of the diffracted field of the reference object helps deducing the phase of the fielddiffracted by the sample. This setup is simple and it is very strong in the presence ofdisturbances because both objects are illuminated with the same incident beam. Moreover,this technique allows us measuring the phase of the diffracted field on a wide range of angleso that a high resolution of the image can be obtained.