Iterative deconvolution technique for measurements of diffraction-limited images on optical microscopes

摘要

Diffraction limit is usually a thorny problem in an optical inspection system. In this investigation, a model-based deconvolution technique was developed to recover diffraction-limited images, where images with sizes smaller than the diffraction limit could be recognized. Experiments were carried out with a traditional microscope at 200× magnification coupled with a halogen light source for a series of line width samples. The point spread function of the imaging optics was first obtained from an estimated model and then combined with a nonlinear deconvolution algorithm to calculate the full width at half maximum and reconstruct the line widths. Experimental results indicate that a measurement error below one pixel size of the measurement system is achievable. Accordingly, the target of nanoscale line width inspection based on a low cost and real-time image processing technique can be fulfilled, which greatly increases the ability of nanoscaling on optical microscopes.