首页> 外文期刊>Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films >Rf-GDOES analysis of composite metal/ceramic electroplated coatings with nano- to microceramic particles' size: Issues in plasma sputtering of Ni/micro-SiC coatings
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Rf-GDOES analysis of composite metal/ceramic electroplated coatings with nano- to microceramic particles' size: Issues in plasma sputtering of Ni/micro-SiC coatings

机译:具有纳米到微陶瓷颗粒尺寸的复合金属/陶瓷电镀涂层的Rf-GDOES分析:Ni / micro-SiC涂层的等离子溅射问题

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摘要

Ni matrix composite coatings reinforced with nano- and microceramic particles were analyzed by radio frequency glow discharge optical emission spectrometry (Rf-GDOES). An interesting phenomenon related to the sputtering and excitation modes of this technique was observed. During plasma sputtering with Rf-GDOES, the micro-SiC particles were detached from metal matrix and did not contribute to the analytical signals. The same was not found in composite coatings containing nanoceramic particles. This anomalous behavior was confirmed by atomic force microscopy (AFM) investigation and scanning electron microscope (SEM) observations into Rf-GDOES craters that showed the presence of residual non-sputtered microparticles. Various attempts were done in order to minimize this problem, mainly by varying the analysis parameters of the used instrumentation, but without any relevant success. Some suggestions were then proposed for explaining the observed phenomenon, moreover possible solutions (e.g. by using a strong magnetic field or changing plasma gas to be more energetic) are discussed.
机译:通过射频辉光放电光发射光谱法(Rf-GDOES)分析了纳米和微陶瓷颗粒增强的Ni基复合涂层。观察到与该技术的溅射和激发模式有关的有趣现象。在用Rf-GDOES进行等离子溅射过程中,微SiC颗粒从金属基质中分离出来,对分析信号无贡献。在含有纳米陶瓷颗粒的复合涂层中未发现同样的情况。这种异常行为已通过原子力显微镜(AFM)调查和扫描电子显微镜(SEM)对Rf-GDOES陨石坑的观察证实,该陨石坑显示出残留的未溅射微粒。为了最大程度地减少此问题,已进行了各种尝试,主要是通过更改所用仪器的分析参数,但是没有取得任何相关的成功。然后提出了一些建议来解释所观察到的现象,此外,还讨论了可能的解决方案(例如,通过使用强磁场或将等离子体气体改变为更高的能量)。

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