首页> 外文期刊>Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films >Manipulation and four-probe analysis of nanowires in UHV by application of four tunneling microscope tips: a new method for the investigation of electrical transport through nanowires
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Manipulation and four-probe analysis of nanowires in UHV by application of four tunneling microscope tips: a new method for the investigation of electrical transport through nanowires

机译:通过应用四个隧道显微镜尖端对超高压中的纳米线进行操作和四探针分析:研究通过纳米线进行电传输的新方法

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摘要

The electrical transport properties of nanosystems, including a few kinds of nanowires, have attracted much attention because of their potential application in nanoelectronics. However, the contact effect or impurities between the nanosystems and electrodes made it difficult to study the intrinsic I-V properties in previous measurements. Here, we present a manipulation and four-terminal method electrical transport measurement of low-dimensional systems using a new instrument consisting of a specially designed tunneling microscope with four tips that can be positioned independently in three dimensions. The electrical conductivities of zinc oxide (ZnO), perylene, gallium sesquioxide (Ga2O3) and cuprum-7,7,8,8'- tetracyanoquinodimethane (Cu-TCNQ) nanowires were obtained. Our results have shown that this technique is a powerful tool for studying the intrinsic transport properties of nanosystems. Copyright (C) 2006 John Wiley & Sons, Ltd.
机译:纳米系统(包括几种纳米线)的电传输特性因其在纳米电子学中的潜在应用而备受关注。然而,纳米系统和电极之间的接触效应或杂质使得难以在先前的测量中研究固有的I-V特性。在这里,我们介绍了一种使用新仪器的低维系统的操纵和四端子法电气传输测量,该仪器由专门设计的隧道显微镜组成,该隧道显微镜具有四个可以在三个维度上独立放置的尖端。获得了氧化锌(ZnO),per,倍半氧化镓(Ga2O3)和铜7,7,8,8'-四氰基喹二甲烷(Cu-TCNQ)纳米线的电导率。我们的结果表明,该技术是研究纳米系统固有传输特性的有力工具。版权所有(C)2006 John Wiley&Sons,Ltd.

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