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XPS studies of octadecylphosphonic acid (OPA) monolayer interactions with some metal and mineral surfaces

机译:XPS研究十八烷基膦酸(OPA)与某些金属和矿物表面的单层相互作用

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摘要

Partial and complete self-assembled monolayers (SAMs) of octadecylphosphonic acid (OPA) have been deposited onto air-exposed surfaces of the metals copper, silver, gold, iron, silicon and aluminium, as well as onto freshly cleaved, air-exposed surfaces of the minerals muscovite and biotite. The line width of the C(1s) signal in the XPS spectra of the surface narrowed, as the extent of coverage increased to 100%, to a half-width of 0.9 eV. Moreover, the line widths associated with the insulating muscovite substrate also became substantially narrower as OPA coverage increased. Binding energy differences on this charge-shifted surface were found to be more consistent when OPA was used as a charge reference, compared to using adventitious carbon as a reference. OPA coverage of the air-exposed metals copper, silver, gold and iron also produced narrow C(1s) spectra whose binding energies were consistently close to 284.9 eV. The C(1s) binding energy positions on Al and Si samples were charge-shifted by the insulating nature of the thin oxide formed on air exposure, or by the insulating nature of the substrate in the case of the minerals. Correction of the observed C(1s) energy position to 284.9 eV gave sets of elemental binding energies for the substrate materials that were reproducible. Thus, OPA coverage could be a possible alternative candidate for use in charge correction of binding energies of insulating materials. The OPA coverage cases were modelled using the software QUASES (TM) Analyse. For the substrates copper, silver, gold, iron and aluminium, analyses of the metal core line spectra gave OPA overlayer thicknesses close to those measured by AFM (1.6 nm). However, QUASES (TM) analyses of the C(1s) extrinsic backgrounds for the same surfaces required the use of an attenuation length of only 0.4 mn to derive a comparable thickness - much lower than literature values for carbon. This discrepancy is ascribed to the structured nature of the SAM. Copyright (c) 2005 John Wiley & Sons, Ltd.
机译:十八烷基膦酸(OPA)的部分和完整的自组装单分子层(SAMs)已沉积到金属的空气暴露表面铜,银,金,铁,硅和铝上,以及刚裂解的空气暴露表面上白云母和黑云母的矿物。随着覆盖率增加到100%,表面XPS光谱中C(1s)信号的线宽变窄至0.9 eV的半宽。此外,随着OPA覆盖率的增加,与绝缘白云母衬底相关的线宽也变得相当窄。与使用不定碳作为参照物相比,当使用OPA作为电荷参照物时,发现该电荷移位表面上的结合能差更加一致。空气中暴露的金属铜,银,金和铁的OPA覆盖也产生了窄C(1s)光谱,其结合能始终接近284.9 eV。 Al和Si样品上的C(1s)结合能位置因暴露于空气中形成的薄氧化物的绝缘性或矿物的情况下受基质的绝缘性而发生电荷移动。将观察到的C(1s)能量位置校正为284.9 eV,可以得到可重现的底物材料元素结合能集。因此,OPA覆盖可能是用于绝缘材料的结合能的电荷校正的可能替代候选物。使用软件QUASES(TM)Analyse对OPA覆盖案例进行建模。对于基板铜,银,金,铁和铝,对金属芯线谱的分析得出OPA覆盖层厚度接近于AFM(1.6 nm)测得的厚度。但是,对于相同表面的C(1s)非本征背景的QUASES(TM)分析要求仅使用0.4 mn的衰减长度来得出可比较的厚度-远低于碳的文献值。这种差异归因于SAM的结构性质。版权所有(c)2005 John Wiley&Sons,Ltd.

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