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首页> 外文期刊>Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films >Phase transmission electron microscopy with aberration correction based on active defocus modulation: dynamic observation of surface atom movement
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Phase transmission electron microscopy with aberration correction based on active defocus modulation: dynamic observation of surface atom movement

机译:基于主动散焦调制的具有像差校正的相透射电镜:表面原子运动的动态观察

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摘要

We have developed a phase transmission electron microscopy system that enables real-time observation of spherical aberration-free phase images based on active defocus modulation. With the use of this system, the cooperative movement of atoms on an Au(011) reconstructed surface was clearly observed at an atomic level. Relaxation of stress in a deformed crystal was also observed when slipping of (111) atom planes occurred. The dynamic behaviour of an atom-sized Au wire that was elongated in the [001] direction was observed at a time resolution of 1/30 s, and its behaviour was different from that of a wire elongated in the [011] direction, which was observed in a previous study. Copyright (C) 2005 John Wiley Sons, Ltd.
机译:我们已经开发了一种相透射电子显微镜系统,该系统可以基于主动散焦调制实时观察无球差的相位图像。通过使用该系统,可以在原子水平上清楚地观察到原子在Au(011)重建表面上的协同运动。当(111)原子平面发生滑动时,也观察到了变形晶体中的应力松弛。在1/30 s的时间分辨率下观察到了沿[001]方向延伸的原子尺寸金线的动态行为,其行为与沿[011]方向延伸的原子线的行为不同。在先前的研究中被观察到。版权所有(C)2005 John Wiley Sons,Ltd.

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