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Organosilane self-assembled monolayers formed at the vapour/solid interface

机译:在蒸气/固体界面形成的有机硅烷自组装单层

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Self-assembly of organosilane molecules at the vapour/solid interface under atmospheric pressure conditions was explored in order to form a monolayer on oxide-covered silicon substrates. Three types of precursors were employed: n-octadecyltrimethoxysilane (ODS: H3C(CH2)(17)Si(OCH3)(3)), n-(6-aminohexyl)aminopropyltrimethoxysilane (AHAPS: H2N(CH2)(6)NH(CH2)(3)Si(OCH3)(3)) and fluoroalkyl-silane (FAS: heptadecafluoro-1,1,2,2-tetrahydro-decyl-l-trimethoxysilane, F3C(CF2)(7)(CH2)(2)Si(OCH3)(3))Characteristics of these self-assembled monolayers (SAMs) formed at a temperature of 100-150degreesC were studied based on ellipsometry and x-ray photoelectron spectroscopy. Chemical properties of the monolayers were characterized further by water contact angle and zeta-potential measurements. The SAMs formed from ODS and FAS were hydrophobic so as to show water contact angles of >100degrees, whereas that of the SAM formed from AHAPS was similar to60degrees. zeta-potentials and isoelectric points (IEPs) Of SiO2 substrates covered with each of the SAMs were measured and compared with a naked SiO2 substrate. The IEPs of the SiO2 substrate covered with the ODS- or FAS-SAM was pH 3.5-4.0, which was almost the same as those of polyethylene and polytetrafluoroethylene plates, whereas that of the naked SiO2 substrate was pH similar to2.0, as predicted from results on silica particles. In the case of the AHAPS-SAM, its surface was positively charged under acidic conditions due to protonation of surface amino groups. Consequently, the AHAPS-SAM-covered substrate showed an IEP of pH 7.5-8.0. Copyright (C) 2002 John Wiley Sons, Ltd. [References: 25]
机译:为了在氧化物覆盖的硅基底上形成单层,探索了在大气压条件下有机硅烷分子在蒸气/固体界面处的自组装。使用了三种类型的前体:正十八烷基三甲氧基硅烷(ODS:H3C(CH2)(17)Si(OCH3)(3)),正-(6-氨基己基)氨基丙基三甲氧基硅烷(AHAPS:H2N(CH2)(6)NH(CH2 )(3)Si(OCH3)(3))和氟代烷基硅烷(FAS:七氟-1,1,2,2-四氢癸基-1-三甲氧基硅烷,F3C(CF2)(7)(CH2)(2)基于椭圆光度法和X射线光电子能谱研究了这些在100-150摄氏度温度下形成的自组装单分子膜(Si)的Si(OCH3)(3))特性。通过水接触角和ζ电势测量进一步表征单层的化学性质。由ODS和FAS形成的SAM是疏水的,显示出大于100度的水接触角,而由AHAPS形成的SAM与60度相似。测量覆盖有每个SAM的SiO2衬底的Zeta电位和等电点(IEP),并将其与裸露的SiO2衬底进行比较。如所预期的,用ODS-或FAS-SAM覆盖的SiO2基材的IEP的pH为3.5-4.0,与聚乙烯和聚四氟乙烯板的IEP几乎相同,而裸露的SiO2基材的IEP的pH接近2.0,如预期的那样二氧化硅颗粒的结果。在AHAPS-SAM的情况下,由于表面氨基的质子化,其表面在酸性条件下带正电。因此,覆盖有AHAPS-SAM的底物的IEP为pH 7.5-8.0。版权所有(C)2002 John Wiley Sons,Ltd. [参考:25]

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