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Interactions between plasma and ionization gauge in plasma immersion ion implantation

机译:等离子体浸没离子注入中等离子体与电离规之间的相互作用

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During plasma processes such as plasma immersion ion implantation-deposition WIII-D), proper monitoring of the working gas pressure is essential as the pressure has a large influence on the discharge behavior and plasma parameters (for example, plasma density, ion distribution, electron temperature, etc.), and consequently the surface properties of the treated samples. The pressure is generally monitored using thermal gauges at low vacuum and ionization gauges at high vacuum. An ionization gauge detects the pressure by measuring the collected ion current that can be affected by the presence of an externally sustained plasma in the vacuum chamber. Its existence can introduce errors in the ion current measured by the ion gauge leading to an erroneous pressure reading. This is also true for PIII experiments conducted using high-voltage glow discharge, that is, with plasma created by biasing the samples with a high negative voltage. The plasma in the ion gauge can work as a seed plasma to help ignite the glow-discharge plasma with a relatively small time delay. At a nitrogen pressure of 2.5 mtorr and voltage of -20 kV, the ionization gauge can expedite the formation of the glow discharge plasma by 10s of mus. These discrepancies must be understood and accounted for in practical applications, as a different gas pressure impacts the plasma chemistry, ion mean free path, and so on. (C) 2003 Elsevier Science B.V. All rights reserved. [References: 15]
机译:在等离子工艺中,例如等离子浸没离子注入-沉积WIII-D),适当监测工作气体压力至关重要,因为压力会对放电行为和等离子参数(例如,等离子密度,离子分布,电子,温度等),并因此处理样品的表面特性。通常使用低真空度的热计和高真空度的电离计监测压力。电离计通过测量收集的离子电流来检测压力,该离子电流可能会受真空室内外部维持的等离子体的影响。它的存在会在离子计测量的离子电流中引入误差,从而导致错误的压力读数。对于使用高压辉光放电进行的PIII实验也是如此,也就是说,通过对样品施加高负电压来产生等离子体。离子规中的等离子体可以用作种子等离子体,以相对较小的时间延迟帮助点燃辉光放电等离子体。在2.5毫托的氮气压力和-20 kV的电压下,电离规可将辉光放电等离子体的形成加速10 s。在实际应用中必须理解并解决这些差异,因为不同的气压会影响等离子体化学性质,离子平均自由程等。 (C)2003 Elsevier Science B.V.保留所有权利。 [参考:15]

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