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Generalized oscillator strengths for inner-shell excitation of SF_6 recorded with a high-performance electron energy loss spectrometer

机译:高性能电子能量损失谱仪记录的SF_6内壳激发的广义振荡器强度

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摘要

The generalized oscillator strength profiles for S 2p, S 2s and F 1s excited and ionized states of sulfur hexafluoride (SF_6) are reported up to very high momentum transfer. These have been measured with a variable impact energy, variable scattering angle electron energy loss spectrometer, which is dedicated to studies of electric dipole (optically allowed) and non-dipole (optically forbidden electric quadrupole and spin-exchange) inner shell electronic transitions of gases, and systematic measurements to their angular and impact energy distributions in order to derive generalized oscillator strength profiles. In addition of presenting the SF_6 results, we describe the design, construction and performance of the instrument, as well as data acquisition and analysis procedures.
机译:据报道,直到非常高的动量传递,六氟化硫(SF_6)的S 2p,S 2s和F 1s激发态和离子化态的广义振荡器强度曲线。这些都是用可变冲击能量,可变散射角电子能量损失光谱仪测量的,该光谱仪专门用于研究电偶极子(光学允许)和非偶极子(光学禁止的四极子和自旋交换)气体的内壳电子跃迁,并对其角和冲击能量分布进行系统测量,以得出广义的振荡器强度曲线。除了提供SF_6结果外,我们还介绍了该仪器的设计,构造和性能以及数据采集和分析程序。

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