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Near-surface mechanical properties and surface morphology of hydrogenated amorphous carbon thin films

机译:氢化非晶碳薄膜的近表面力学性能和表面形貌

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The study of the near-surface nanomechanical properties of thin films is a very ambitious task and can be accomplished by advanced surface sensitive techniques. Depth-sensing nanoindentation (NI) is a widely used technique for the nanomechanical characterization of thin films, but it has the inherent limitation of the substrate influence to the measured hardness (H) and elastic modulus (E). Thus, sophisticated modeling is required to determine H and E at the surface. On the other hand, surface acoustic methods seem more promising for such a study. Among them, atomic force acoustic microscopy (AFAM) is a scanning probe microscopy technique based on the resonant vibration of the AFM cantilever. In this work, we study the near-surface nanomechanical properties and the surface morphology of soft hydrogenated amorphous carbon (a-C:H) thin films. We use NI, employing the continuous stifffiess measurements technique, and AFAM for the imaging of the variations of the surface mechanical properties and the accurate determination of the elastic modulus. We analyze NI data using empirical models in order to estimate near-surface E and H and the results are compared to those obtained by AFAM. From depth-sensing NI, it was found that the a-C:H thin films present "pop-in" events, which are eliminated by changing the deposition conditions e.g. increasing the negative bias voltage to the substrate (V-b). Near-surface H and E of the a-C:H thin films measured with nanoindentation were found to initially increase with increasing vertical bar V-b vertical bar. Further increase of vertical bar V-b vertical bar has no effect on the E and H values. Finally, by comparing the results from AFAM and NI, we conclude that the obtained values for E by NI are lower for all the a-C:H thin films. (c) 2005 Elsevier B.V. All rights reserved.
机译:薄膜的近表面纳米机械性能的研究是一项非常艰巨的任务,可以通过先进的表面敏感技术来完成。深度感应纳米压痕(NI)是一种广泛用于薄膜的纳米力学表征的技术,但是它对测量硬度(H)和弹性模量(E)具有内在的影响。因此,需要复杂的建模来确定表面的H和E。另一方面,表面声学方法对于这种研究似乎更有希望。其中,原子力声学显微镜(AFAM)是一种基于AFM悬臂的共振振动的扫描探针显微镜技术。在这项工作中,我们研究了软氢化非晶碳(a-C:H)薄膜的近表面纳米机械性能和表面形态。我们使用NI,并采用连续刚度测量技术和AFAM来成像表面机械性能的变化并精确确定弹性模量。我们使用经验模型分析NI数据,以估计近地表E和H,并将结果与​​AFAM获得的结果进行比较。从深度感测NI中,发现a-C:H薄膜呈现“弹入”事件,通过改变沉积条件,例如沉积条件,可以消除这些事件。增加对衬底的负偏压(V-b)。发现用纳米压痕法测量的a-C:H薄膜的近表面H和E最初随垂直棒V-b垂直棒的增加而增加。垂直线的进一步增加V-b垂直线对E和H值没有影响。最后,通过比较AFAM和NI的结果,我们得出结论,对于所有a-C:H薄膜,NI获得的E值都较低。 (c)2005 Elsevier B.V.保留所有权利。

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