CHARACTERIZATION OF NANOSTRUCTURES BY TRANSMISSION ELECTRON MICROSCOPY

摘要

Characterization of nano-structures involves ascertaining their shape and size besides finding out the atomic arrangement inside these and their composition. Because of its ability to do imaging at an atomic scale, nanobeam diffraction and nanobeam composition analysis, the modern transmission electron microscope (TEM) has emerged as a complete characterization tool for examination of nanostructures. In this paper, examples are cited from the examination of various types of nanostructures in the TEM, with particular emphasis on the study of nanocrystalline materials. Besides nanocrystalline materials use of TEM in the study of nanotubes, mesoporous molecular materials and nanolayered materials have also been described.