首页> 外文期刊>The American Journal of Cardiology >Failure Rates of Single- Versus Dual-Coil Nonrecalled Sprint Quattro Defibrillator Leads
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Failure Rates of Single- Versus Dual-Coil Nonrecalled Sprint Quattro Defibrillator Leads

机译:单线圈对双线圈非召回Sprint Quattro除颤器导线的失效率

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摘要

Electrical failure is more common in single-coil compared with dual-coil implantable cardioverter defibrillator (ICD) leads in the case of the recalled Riata lead. Single-coil leads are however favored in most patients given their lower risk of extraction. We therefore evaluated the failure-free survival of, single- versus dual-coil ICD leads not included in Food and Drug Administration recalls. All patients receiving a Medtronic transvenous Sprint Quattro single- or dual-coil ICD lead were included in this analysis. Leads were followed to the end point of electrical failure. A total of 1,020 dual-coil and 631 single-coil ICD leads were implanted at our institution from November 2000 to March 2014. As expected, dual-coil leads had a longer followup time (3.4 +/- 2.6 years vs 1.3 +/- 1.0 years, p <0.001) because they were approved many years earlier by the Food and Drug Administration. The overall lead survival rates free from electrical failure at 1, 2, and 3 years after implantation were 98.8%, 98.2%, and 95.1%, respectively, for the single-coil leads versus 99.7%, 99.4%, and 99.3%, respectively, for the dual-coil leads (p = 0.0013). In conclusion, single-coil leads are associated with higher electrical failure rates compared with dual-coil leads even for nonrecalled lead models from the same family and manufacturer. These findings have implications on the choice of ICD lead at the time of device implantation. (C) 2015 Elsevier Inc. All rights reserved.
机译:在召回Riata导线的情况下,与双线圈植入式心脏复律除颤器(ICD)导线相比,单线圈电气故障更为常见。但是,由于大多数患者单根铅的拔出风险较低,因此它们受到青睐。因此,我们评估了美国食品药品管理局召回中未包括的单线圈和双线圈ICD引线的无故障存活率。所有接受美敦力(Medtronic)静脉Sprint Quattro单线圈或双线圈ICD引线的患者均包括在该分析中。引线一直到电气故障的终点。从2000年11月到2014年3月,我们的机构共植入了1,020个双线圈和631个单线圈ICD引线。正如预期的,双线圈引线的随访时间更长(3.4 +/- 2.6年vs 1.3 +/- 1.0年,p <0.001),因为它们早在许多年前就被食品药品监督管理局批准。植入后1、2和3年,无电气故障的总铅存活率分别为98.8%,98.2%和95.1%,而单线圈铅分别为99.7%,99.4%和99.3% ,对于双线圈引线(p = 0.0013)。总之,即使对于同一系列和制造商的未召回导线模型,单线圈导线也比双线圈导线具有更高的电气故障率。这些发现对装置植入时ICD导联的选择有影响。 (C)2015 Elsevier Inc.保留所有权利。

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