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Photoluminescence quenching and intensity fluctuations of CdSe-ZnS quantum dots on an Ag nanoparticle film

机译:Ag纳米颗粒膜上CdSe-ZnS量子点的光致发光猝灭和强度涨落

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摘要

Intermittent "on" and "off (blinking) photoluminescence (PL) of single-CdSe/ZnS quantum dots (QDs) is modified when placed on an Ag nanoparticle (NP) film into stochastic fluctuations with nonzero intensity "off" (pseudo off) periods. Also, the PL quantum efficiency (from 0.42 to 0.22) and lifetime (from 5.2 to 1.5 ns) of QDs are considerably decreased at ensemble level in the presence of Ag NPs, and a histogram of the PL lifetime of single-QDs is shifted (from 4.2 to 1.7 ns) and tapered (full width at half-maximum from 3.3 to 1.1 ns) when placed on an Ag NP film. The quenching of the PL quantum efficiency and decrease of the PL lifetime are attributed to ultrafast energy transfer from photoexcited QDs to Ag NPs. The energy-transfer process competes with exciton relaxations and influences carrier trapping in surface defect-states (band gap defects) and Auger relaxation, which are considered to be the origins of blinking. The contribution of surface-states on the modified PL was identified from decreased contribution of a slow component to the PL decays of ensemble- and single-QDs in the presence of Ag NPs. On the basis of ensemble averaged PL intensity and lifetime and single-QD lifetime and intensity trajectory analyses, we propose that the energy-transfer process from photoexcited QDs to Ag NPs result a redistribution of relaxation processes and provide fluctuating trajectories with nonzero intensities to single-QDs. Apart from the observations of modified blinking and narrow lifetime distribution of QDs, the current work partially supports a model proposed by Markus and co-workers that blinking is related to localization of charge carriers in defects.
机译:当将单CdSe / ZnS量子点(QD)的间歇性“开”和“关(闪烁)光致发光(PL)”修改为当放置在银纳米颗粒(NP)薄膜上时具有非零强度“关”的随机波动(伪关)同样,在存在Ag NP的情况下,量子点的PL量子效率(从0.42到0.22)和寿命(从5.2到1.5 ns)在集合水平上显着降低,单个QD的PL寿命的直方图为放置在Ag NP薄膜上时发生位移(从4.2到1.7 ns)并逐渐减小(半最大宽度从3.3到1.1 ns),PL量子效率的猝灭和PL寿命的降低归因于超快的能量转移从光激发量子点到银纳米粒子,能量转移过程与激子弛豫竞争,并影响表面缺陷态(带隙缺陷)和俄歇弛豫的载流子俘获,这被认为是闪烁的起源。修改后的PL上的标识这是由于在存在银纳米颗粒的情况下,慢速成分对整体和单量子点的PL衰变的贡献减少。基于整体平均PL强度和寿命以及单QD寿命和强度轨迹分析,我们建议从光激发QD到Ag NP的能量转移过程导致弛豫过程重新分布,并提供非零强度的波动轨迹到单QD。除了观察到改进的闪烁和量子点的寿命分布狭窄以外,当前的工作部分支持了Markus和同事提出的模型,即闪烁与缺陷中电荷载流子的定位有关。

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