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首页> 外文期刊>The International Journal of Advanced Manufacturing Technology >Evaluation of microstructural changes by X-ray diffraction peak profile and focused ion beam/scanning ion microscope analysis
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Evaluation of microstructural changes by X-ray diffraction peak profile and focused ion beam/scanning ion microscope analysis

机译:通过X射线衍射峰轮廓和聚焦离子束/扫描离子显微镜分析评估微观结构变化

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摘要

Microstructure in subsurface is investigated to understand the effect of cryogenic coolant in hard machining of hardened AISI 52100 bearing steel. The cutting experiments were performed under dry and cryogenic cooling conditions using cubic boron nitride (CBN) tool inserts. The change in the microstructure was analyzed at varying of the tool shape and cutting speed for different initial hardness of the workpiece. The machined surfaces and subsurface were analyzed by several investigation techniques. The affected layer depth was observed with a scanning electron microscope (SEM), while the phase composition was analyzed by X-ray diffraction (XRD). The grain size has been directly measured with a focused ion beam and scanning ion microscope (FIB-SIM) and compared with an indirect method of analysis: X-ray diffraction peak profile (XDPP). The experimental results show that the microstructural phase strongly depends on the cutting process parameters. Furthermore, when the cryogenic cooling is applied, martensitic structure disappears in some cases. The grain size on the machined surfaces is also influenced by the material properties and the process parameters. In addition, it is demonstrated that the XDPP indirect method for grain size analysis is a valid alternative to the direct method.
机译:研究了地下的微观结构,以了解低温冷却剂在硬化AISI 52100轴承钢的硬加工中的作用。切削实验是使用立方氮化硼(CBN)工具刀片在干燥和低温冷却条件下进行的。针对不同初始硬度的工件,通过改变刀具形状和切削速度来分析微观结构的变化。通过几种调查技术对加工的表面和亚表面进行了分析。用扫描电子显微镜(SEM)观察受影响的层深度,同时通过X射线衍射(XRD)分析相组成。晶粒尺寸已通过聚焦离子束和扫描离子显微镜(FIB-SIM)直接测量,并与间接分析方法X射线衍射峰轮廓(XDPP)进行了比较。实验结果表明,微观结构阶段很大程度上取决于切削工艺参数。此外,当进行低温冷却时,在某些情况下马氏体结构消失。加工表面的晶粒尺寸也受材料性能和工艺参数的影响。另外,证明了用于粒度分析的XDPP间接方法是直接方法的有效替代方法。

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