...
首页> 外文期刊>Ultramicroscopy >Current status and future directions for in situ transmission electron microscopy
【24h】

Current status and future directions for in situ transmission electron microscopy

机译:原位透射电子显微镜的现状和未来方向

获取原文
获取原文并翻译 | 示例

摘要

This review article discusses the current and future possibilities for the application of in situ transmission electron microscopy to reveal synthesis pathways and functional mechanisms in complex and nanoscale materials. The findings of a group of scientists, representing academia, government labs and private sector entities (predominantly commercial vendors) during a workshop, held at the Center for Nanoscale Science and Technology-National Institute of Science and Technology (CNST-NIST), are discussed. We provide a comprehensive review of the scientific needs and future instrument and technique developments required to meet them. Published by Elsevier B.V.
机译:这篇评论文章讨论了原位透射电子显微镜的应用的当前和未来可能性,以揭示复杂和纳米级材料中的合成途径和功能机理。讨论了代表学术界,政府实验室和私营部门实体(主要是商业供应商)的一组科学家在研讨会上的发现,该研讨会在纳米级科学技术中心-国家科学技术研究院(CNST-NIST)举行。我们对科学需求以及满足这些需求所需要的未来仪器和技术发展进行了全面回顾。由Elsevier B.V.发布

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号