首页> 外文期刊>Ultramicroscopy >Oxidation-state sensitive imaging of cerium dioxide by atomic-resolution low-angle annular dark field scanning transmission electron microscopy
【24h】

Oxidation-state sensitive imaging of cerium dioxide by atomic-resolution low-angle annular dark field scanning transmission electron microscopy

机译:原子分辨率低角度环形暗场扫描透射电子显微镜对二氧化铈的氧化态敏感成像

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

Low-angle annular dark field (LAADF) scanning transmission electron microscopy (STEM) imaging is presented as a method that is sensitive to the oxidation state of cerium ions in CeO2 nanoparticles. This relationship was validated through electron energy loss spectroscopy (EELS), in situ measurements, as well as multislice image simulations. Static displacements caused by the increased ionic radius of Ce3+ influence the electron channeling process and increase electron scattering to low angles while reducing scatter to high angles. This process manifests itself by reducing the high-angle annular dark field (HAADF) signal intensity while increasing the LAADF signal intensity in close proximity to Ce3+ ions. This technique can supplement STEM-EELS and in so doing, relax the experimental challenges associated with acquiring oxidation state information at high spatial resolutions. Published by Elsevier B.V.
机译:低角度环形暗场(LAADF)扫描透射电子显微镜(STEM)成像是一种对CeO2纳米颗粒中铈离子的氧化态敏感的方法。这种关系通过电子能量损失谱(EELS),原位测量以及多层图像模拟得到了验证。由于Ce3 +的离子半径增加而引起的静态位移会影响电子沟道过程,并增加电子向低角度的散射,同时减小向高角度的散射。此过程通过降低高角度环形暗场(HAADF)信号强度同时增加紧邻Ce3 +离子的LAADF信号强度来体现。该技术可以补充STEM-EELS,从而可以缓解与以高空间分辨率获取氧化态信息相关的实验挑战。由Elsevier B.V.发布

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号