X-ray analysis and mapping by wavelength dispersive X-ray spectroscopy in an electron microscope

摘要

A compact and easy-to-use wavelength dispersive X-ray spectrometer using a multi-capillary X-ray lens attached to a scanning (transmission) electron microscope has been tested for thin-film analysis. B-K spectra from thin-film boron compounds (B_4C, h-BN, and B_2O_3) samples showed prominent peak shifts and detailed structural differences. Mapping images of a thin W/Si double-layer sample resolved each element clearly. Additionally, a thin SiO_2 film grown on a Si substrate was imaged with O-K X-rays. Energy and spatial resolution of the system is also discussed.