...
首页> 外文期刊>UK & Ireland Labmate >Experimental Results using a High Vacuum Soldering and Brazing Hood Furnace
【24h】

Experimental Results using a High Vacuum Soldering and Brazing Hood Furnace

机译:使用高真空钎焊和铜焊罩炉的实验结果

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

Nowadays many components, for example devices used in electron microscopes, satellites or aircrafts, have to withstand challenging environments such as vacuum or extremely high temperatures. To manufacture reliable components like these a connection between dissimilar materials is often required. This connection can be metal-to-metal or even insulator-to-metal. It has to be strong, high temperature resistant and suitable for use in vacuum, as outgassing of flux material is not acceptable. The purpose of flux material is to remove remaining oxides and to reduce the surface tension in order to promote wetting of the dissimilar materials' surfaces. However, if exposed to vacuum or a high temperature environment, the effects of the flux on the electronic component are harmful. The flux material, which contains acid and salts, changes into the gaseous phase due to its high vapour pressure. The resulting condensation of the flux material on the insulators may produce conductive paths causing a leakage current. This process will destroy the expensive component. Unfortunately, the most active (and therefore corrosive) fluxes also form the strongest connections. Some material properties, for example vacuum resistance, cannot be obtained when manufacturing under conventional atmosphere conditions. One other problem with conventional atmospheres is that gas impurities are always embedded in the connecting surface.
机译:如今,许多组件(例如,用于电子显微镜,卫星或飞机的设备)必须承受严峻的环境,例如真空或极高的温度。为了制造这样的可靠组件,通常需要在不同材料之间建立连接。此连接可以是金属对金属,甚至是绝缘体对金属。它必须坚固,耐高温并且适合在真空中使用,因为助焊剂材料的除气是不可接受的。助熔剂材料的目的是去除残留的氧化物并降低表面张力,以促进异种材料表面的润湿。但是,如果暴露在真空或高温环境中,助焊剂对电子组件的影响是有害的。含有酸和盐的助焊剂材料由于其高蒸气压而变成气相。助熔剂材料在绝缘子上的最终凝结会产生导电路径,从而导致泄漏电流。此过程将破坏昂贵的组件。不幸的是,最活跃(因此具有腐蚀性)的焊剂也形成了最牢固的连接。在常规大气条件下制造时,无法获得某些材料性能,例如耐真空性。传统气氛的另一个问题是气体杂质总是埋在连接表面中。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号