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Absolute calibration and characterization of the multiband imaging photometer for spitzer. II. 70 mu m imaging

机译:Spitzer多波段成像光度计的绝对校准和表征。二。 70微米成像

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The absolute calibration and characterization of the Multiband Imaging Photometer for Spitzer (MIPS) 70 mu m coarse- and fine-scale imaging modes are presented based on over 2.5 yr of observations. Accurate photometry ( especially for faint sources) requires two simple processing steps beyond the standard data reduction to remove long-term detector transients. Point-spread function (PSF) fitting photometry is found to give more accurate flux densities than aperture photometry. Based on the PSF fitting photometry, the calibration factor shows no strong trend with flux density, background, spectral type, exposure time, or time since anneals. The coarse- scale calibration sample includes observations of stars with flux densities from 22 mJy to 17 Jy, on backgrounds from 4 to 26 MJy sr(-1), and with spectral types from B to M. The coarse- scale calibration is 702 +/- 35 MJy sr(-1) MIPS70(-1) (5% uncertainty) and is based on measurements of 66 stars. The instrumental units of the MIPS 70 mm coarse- and fine-scale imaging modes are called MIPS70 and MIPS70F, respectively. The photometric repeatability is calculated to be 4.5% from two stars measured during every MIPS campaign and includes variations on all timescales probed. The preliminary fine-scale calibration factor is 2894 +/- 294 MJy sr(-1) MIPS70F(-1) (10% uncertainty) based on 10 stars. The uncertainties in the coarse- and fine-scale calibration factors are dominated by the 4.5% photometric repeatability and the small sample size, respectively. The 5 sigma, 500 s sensitivity of the coarse- scale observations is 6-8 mJy. This work shows that the 5 sigma MIPS 70 mm array produces accurate, well-calibrated photometry and validates the MIPS 70 mu m operating strategy, especially the use of frequent stimulator flashes to track the changing responsivities of the Ge:Ga detectors.
机译:基于超过2.5年的观测结果,给出了Spitzer多波段成像光度计(MIPS)70微米的粗略和精细成像模式的绝对校准和表征。准确的测光法(特别是对于微弱的光源)需要两个简单的处理步骤,超出标准的数据缩减范围,以消除长期的探测器瞬态现象。发现点扩展函数(PSF)拟合光度法比孔径光度法可提供更准确的通量密度。基于PSF拟合光度法,校正因数在通量密度,背景,光谱类型,曝光时间或退火时间之后均无明显趋势。粗标定样本包括观测到的星,其通量密度为22 mJy至17 Jy,背景为4至26 MJy sr(-1),光谱类型为B至M。标定为702 + /-35 MJy sr(-1)MIPS70(-1)(不确定性为5%),基于对66星的测量。 MIPS 70毫米粗略和精细比例成像模式的仪器单元分别称为MIPS70和MIPS70F。根据每次MIPS活动期间测得的两颗星计算得出的光度可重复性为4.5%,其中包括所探测的所有时间范围的变化。初步的精细刻度校准因子是2894 +/- 294 MJy sr(-1)MIPS70F(-1)(不确定度为10%),基于10星。粗尺度和精细尺度校正因子的不确定性分别由4.5%的光度重复性和小样本量决定。粗尺度观测值的5σ,500 s灵敏度为6-8 mJy。这项工作表明,5 sigma MIPS 70 mm阵列可产生准确的,经过良好校准的光度学,并验证了MIPS 70μm的操作策略,尤其是使用频繁的刺激闪光来跟踪Ge:Ga检测器变化的响应度。

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