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Role of adhesion in the metal-semiconductor phase transition in polycrystalline vanadium dioxide films

机译:粘附在多晶二氧化钒薄膜中金属-半导体相变中的作用

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摘要

Etching of thin polycrystalline films of vanadium dioxide with hydrofluoric acid vapor has offered a possibility to reveal a significant influence of the extent of adhesion on the temperature position and shape of the hysteresis loop of the reflectivity. It has been established that, in the cases where silicon is used as a substrate, etching at room temperature is accompanied by incorporation of hydrogen into thin films of vanadium dioxide.
机译:用氢氟酸蒸气对二氧化钒的多晶薄膜进行蚀刻提供了一种可能性,可以揭示粘附程度对反射率的温度位置和滞后回线形状的重大影响。已经确定,在将硅用作衬底的情况下,在室温下进行蚀刻的同时将氢结合到二氧化钒的薄膜中。

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